DiVeR: Decision-Critical Verifier Learning for VLA Test-Time Scaling
Seongheon Park, Heecheol Kim, Shulin Tian, Lilika Makabe, Namiko Saito, Katsushi Ikeuchi, Sharon Li, Yasuyuki Matsushita
October 2026
arXiv | October 2026
Preprint
Seongheon Park, Heecheol Kim, Shulin Tian, Lilika Makabe, Namiko Saito, Katsushi Ikeuchi, Sharon Li, Yasuyuki Matsushita
October 2026
arXiv | October 2026
Preprint
Heecheol Kim, Namiko Saito, Katsushi Ikeuchi, Yasuyuki Matsushita
June 2026
arXiv | June 2026
Seongheon Park, Heecheol Kim, Shulin Tian, Lilika Makabe, Namiko Saito, Katsushi Ikeuchi, Sharon Li, Yasuyuki Matsushita
October 2026
arXiv | October 2026
Preprint
Heecheol Kim, Namiko Saito, Katsushi Ikeuchi, Yasuyuki Matsushita
June 2026
arXiv | June 2026
Seongheon Park, Heecheol Kim, Shulin Tian, Lilika Makabe, Namiko Saito, Katsushi Ikeuchi, Sharon Li, Yasuyuki Matsushita
October 2026
arXiv | October 2026
Preprint
Seongheon Park, Heecheol Kim, Shulin Tian, Lilika Makabe, Namiko Saito, Katsushi Ikeuchi, Sharon Li, Yasuyuki Matsushita
October 2026
arXiv | October 2026
Preprint
Heecheol Kim, Namiko Saito, Katsushi Ikeuchi, Yasuyuki Matsushita
June 2026
arXiv | June 2026